Zeiss Axiolab A Especificaciones descargar pdf (Pagina 103)

OPERATION

Axio Lab.A1 Lighting and contrasting method in reflected light Carl Zeiss

04/2013 430037-7144-001 103

4.2.2 Adjusting the reflected light darkfield

(1) Application

The reflected light darkfield method is used for examining incompletely reflecting surfaces with different

degrees of reflectivity (ideal reflected light brightfield specimens), i.e. with scratches, ruptures, pores or

other disruptions to the even surface. All these light-scattering details light up brightly in the darkfield,

whereas the even surface remains dark.

(2) Instrumentation

Observations in the reflected light darkfield can only be made on Axio Lab.A1 microscopes for reflected

light.

 Epiplan-Neofluar, EC Epiplan-Neofluar, Epiplan objectives with the additional designation “HD”

 Reflector module darkfield ACR P&C for reflected light

The stand for reflected light is equipped with a built-in darkfield stop.

(3) Adjusting the reflected light darkfield

x Adjust the microscope as described in Section 4.2 for the reflected light brightfield. In order to avoid

reflexes, the displayed luminous-field aperture should be located slightly beyond the edge of the field

of view.

x If used, remove the 6x20 compensator slide.

x Swivel in the objective position with darkfield objective (HD) on the nosepiece.

x If necessary, swivel in the reflector module darkfield on the reflector turret.

x Completely open the aperture diaphragm and switch off or remove the neutral filter as necessary.

x Place the specimen on the stage and sharpen the image.

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Zeiss Axiolab A Especificaciones Pagina 103