Zeiss LSM 510 META Especificaciones Pagina 115

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OPERATION
LSM 510 Image Acquisition (Acquire)
B 40-051 e 07/98 4-57
4.5.4.2 Z mode
This mode allows you to create a stack of images
at different Z levels (slices).
In the "Scan Control" window on the
<Z Stack> button.
This opens the Z Settings panel in the
"Scan Control" window.
The scanning range in Z can be determined as an
option via the following functions:
Z Sectioning (input of numerical values)
Cutline and Range (in monitor dialog with
the specimen)
Mark First/Last (in monitor dialog with the
specimen)
Z Sectioning
Activate the Z Sectioning register
Use the Num Slices slider to select the number
of slices in the stack.
Use the Interval [µm] slider to select the
Z interval between successive slices.
Use the Current Slice slider to select the center
of the stack.
Click on the <Start> button to trigger Z Sectioning.
Optimization of intervals, number of slices and
pinhole diameter
Click on the <Z Slice> button to determine the
optimum interval
The Optical Slice dialog box (see Fig 4-59) will
appear, from which the optimum interval
(depending on the used objective and pinhole
diameter) can be seen and made available to the
active mode.
Clicking on the <Optimal Pinhole Diameter>
button also enables the optimum pinhole diameter
to be set.
Fig. 4-57
Fig. 4-58
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